Investigating Read-After-Write Delay in Ferroelectric FET with Gate-Side Injection

Sizhe Ma, Saikat Chakraborty, Yixin Qin, Zijian Zhao, Jiahui Duan, Moonyoung Jung, Kijoon Kim,Suhwan Lim, Kwangyou Seo, Kwangsoo Kim, Wanki Kim,Daewon Ha,Vijaykrishnan Narayanan, Jaydeep P. Kulkarni,Kai Ni

2025 IEEE International Reliability Physics Symposium (IRPS)（2025）

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Key words

Ferroelectricss,MIFIS FeFET,RAWD,gate-side injection(GSI),depolarization field

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