Memory Window and Variability Modeling of Multi- Domain Al:HfO2Ferroelectric NAND Memory

Kuan–Hung Liu,Tue Gunst, Ko–Hsin Lee,Anders Blom,Xi–Wei Lin

2024 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)（2024）

引用 0|浏览3

关键词

Ferroelectric,HfO2,Al composition,Fe-NAND,Density functional theory,TCAD simulation

AI 理解论文

溯源树

样例

生成溯源树，研究论文发展脉络

Chat Paper

正在生成论文摘要