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论文共 49 篇作者统计合作学者相似作者

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Modeling of Negative Bias Temperature Instability (NBTI) for Gate-All-Around (GAA) Stacked Nanosheet Technology
Leitao Liu, Jingtian Fang,Ashish Pal,Plamen Asenov,Mohit Bajaj, Bei Deng,Xi-Wei Lin,Souvik Mahapatra,Subi Kengeri,El Mehdi Bazizi
2024 IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM, IRPS 2024 (2024)
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3DIC System-Technology Co-Optimization with a Focus on the Interplay of Thermal, Power, Timing, and Stress Effects
Victor Moroz, Xiaopeng Xu,Alexei Svizhenko,Xi-Wei Lin, Sergey Popov,Henry Sheng, Kenneth Larsen
Symposium on VLSI Technologypp.1-2, (2024)
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Modeling and Simulation for DRAM and Flash Memory Technology Exploration and Development
Xi-Wei Lin,Salvatore Maria Amoroso,Ko-Hsin Lee, Meng Hsuan Ke,Tue Gunst, Pavel Tikhomirov,Plamen Asenov
2024 IEEE INTERNATIONAL MEMORY WORKSHOP, IMW (2024)
引用1浏览0EIWOS引用
1
0
Memory Window and Variability Modeling of Multi- Domain Al:HfO2Ferroelectric NAND Memory
Kuan–Hung Liu,Tue Gunst, Ko–Hsin Lee,Anders Blom,Xi–Wei Lin
2024 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)pp.01-04, (2024)
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A Multiscale Simulation Approach for Program Noise and Cross-temperature Effects in 3D NANDs
Keng-Hua Lin,Salvatore Maria Amoroso, Po-Chou Chen, Yueh-Ying Tseng,Andrew R. Brown,Plamen Asenov, U. G. Vej-Hansen,Xi-Wei Lin,Anders Blom,Victor Moroz, Chih-Chiang Wang
2024 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)pp.1-4, (2024)
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作者统计

#Papers: 49

#Citation: 667

H-Index: 17

G-Index: 25

Sociability: 4

Diversity: 1

Activity: 2

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