V-Pits and Trench-Like Defects in High Periodicity MQWs GaN-Based Solar Cells: Extensive Electro-Optical Analysis
IEEE TRANSACTIONS ON ELECTRON DEVICES（2024）
关键词
Quantum well devices,Photovoltaic cells,Microscopy,Transmission electron microscopy,Scanning electron microscopy,Measurement by laser beam,Substrates,GaN,InGaN,micro-electroluminescence ( mu -EL),micro-photoluminescence ( mu-PL),microscopy,multiple-quantum-well (MQW),solar cells,trench-like,V pits
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