Predicting the Number of Fatal Soft Errors in Los Alamos National Laboratory'S Asc Q Supercomputer
IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY（2005）
关键词
cosmic-ray-induced neutron,life estimation,linear accelerators,memory testing,neutron beam,neutron-induced soft error,neutron radiation effects,semiconductor-device radiation effects,semiconductor-device testing,single-event upset,soft-error rate,static random access memory (SRAM) chips
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