Backside Fault Localization and Defect Physical Analysis of Degraded Power HEMT P-Gan Transistors Stressed in DC and AC Switching Modes

L. Ghizzo,G. Guibaud, C. De Nardi, F. Jamin,V. Chazal,D. Trémouilles,R. Monflier,F. Richardeau,G. Bascoul,M. González

International Symposium for Testing and Failure Analysis ISTFA 2023 Conference Proceedings from the 49th International Symposium for Testing and Failure Analysis（2023）

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