订阅小程序
旧版功能

Characterization of Near Conduction Band SiC/SiO2 Interface Traps in Commercial 4H-SiC Power MOSFETs

Hema Lata Rao Maddi,Suvendu Nayak,Vishank Talesara,Yibo Xu,Wu Lu,Anant K. Agarwal

2022 IEEE 9th Workshop on Wide Bandgap Power Devices & Applications (WiPDA)（2022）

引用 0|浏览4
AI 理解论文
溯源树
样例
生成溯源树，研究论文发展脉络
Chat Paper
正在生成论文摘要