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Single Photon Avalanche Diode with Monte Carlo Simulations: PDE, Jitter and Quench Probability

D. Rideau, Y. Oussaiti,J. Grebot,R. Helleboid,A. Lopez,G. Mugny, E. Bourreau,D. Golanski,B. Mamdy, H. Wehbe Alause,I Nicholson,S. Pellegrini, C. E. Vlimant,M. Agnew,T. Cazimajou,M. Pala,J. Saint-Martin,P. Dollfus

2021 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)（2021）

Cited 3|Views2
Key words
Semiconductor device measurement,Monte Carlo methods,Jitter,Silicon,Distance measurement,Timing,Semiconductor process modeling
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