Comprehensive Modeling and Characterization of Photon Detection Efficiency and Jitter Tail in Advanced SPAD Devices

Remi Helleboid,Denis Rideau,Isobel Nicholson,Norbert Moussy,Olivier Saxod,Marie Basset,Jeremy Grebot, Antonin Zimmerman,Bastien Mamdy,Dominique Golanski,Megan Agnew,Sara Pellegrini,Mathieu Sicre

IEEE Journal of the Electron Devices Society（2022）

引用 7|浏览11

关键词

Avalanche breakdown probability,breakdown voltage,jitter,photon detection efficiency (PDE),single-photon avalanche diode (SPAD),technology computer-aided design (TCAD)

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