Total Ionizing Dose Effect on Voltage Controlled Ring Oscillator in 65nm CMOS
2025 6th International Conference on Radiation Effects of Electronic Devices (ICREED)（2025）
Key words
Dose Concentration,65-nm CMOS,Ring Voltage-controlled Oscillator,Total Ionizing Dose Effect,Carrier Mobility,Current Source,Oscillation Frequency,Analog-to-digital Converter,Transconductance,Phase-locked Loop,CMOS Technology,Input Pair,Large Hadron Collider,Tail Current,Voltage Swing,Differential Pair
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