A 10-Bit 50-Ms/s Radiation Tolerant Split Coarse/Fine SAR ADC in 65-Nm CMOS
IEEE Transactions on Very Large Scale Integration (VLSI) Systems（2025）
Key words
Metastability tolerant,radiation hardened by design (RHBD),radiation tolerant,single-event effect (SEE),split analog-to-digital converter (ADC),subranging SAR ADC,total ionizing dose (TID)
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