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The First Switch Effect in Ferroelectric Field-Effect Transistors

Priyankka Ravikumar, Prasanna Venkatesan,Chinsung Park, Nashrah Afroze,Mengkun Tian,Winston Chern,Suman Datta,Shimeng Yu,Souvik Mahapatra,Asif Khan

IEEE Transactions on Device and Materials Reliability（2025）

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关键词
HfO2-based Ferroelectrics,FEFET,Endurance,Charge pumping
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