Radiation-Resilient Amorphous Indium Oxide FEFETs for Embedded Nonvolatile Memory

Sharadindu Gopal Kirtania, Faaiq G. Waqar, Dyutimoy Chakraborty, Jaewon Shin, E. Sarkar,Justin Reiss, Jason Dean Yeager,Douglas E. Wolfe,Shimeng Yu,Suman Datta

2025 IEEE International Reliability Physics Symposium (IRPS)（2025）

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Radiation-hardened memory,Neutron irradiation,HZO,Indium oxide (IWO),FEFET,back-end-of-line (BEOL),embedded memory,NVM,Endurance,Retention,Defect mitigation,1T-1FEFET RAM

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