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A Kalman Filter Method Based on Adaptive Thermal Model for Online Junction Temperature Estimation of SiC MOSFET

Zehua Fu,Wei Wu,Yong Chen,Zhangyong Chen, Xin Tong, Lehan Xu

IEEE Transactions on Device and Materials Reliability(2025)

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Key words
Junction temperature,Kalman filter,solder aging,SiC MOSFET,thermal sensitivity electrical parameter (TSEP),thermal model
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