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Simulation and Analysis of Dynamic Process Distribution Effect of High Voltage IGBT

Wanru SUN,Yaohua WANG,Jiang LIU,Mingchao GAO, Li LI,Cui LI, Ruifen NIE,Rui JIN

doaj(2021)

Cited 0|Views0
Key words
IGBT,current concentration effect,gate resistance,gate distributed resistance,temperature distribution
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