Exploring Robustness of Image Recognition Models on Hardware Accelerators

Nikolaos Louloudakis, Perry Gibson,José Cano,Ajitha Rajan

2025 IEEE International Conference on Software Testing, Verification and Validation Workshops (ICSTW)（2025）

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关键词

Image Recognition,Hardware Accelerators,Image Recognition Models,Deep Neural Network,Test In Order,Presence Of Defects,Deep Neural Network Model,Mutation Testing,Variety Of Devices,Use Of Artificial Intelligence,Convolutional Neural Network,Object Detection,ImageNet,System Architecture,Analysis Module,Test Suite,Generation Of Mutants,Output Dimension,Hardware Devices,Output Label,Conditional Statements,Levenshtein Distance,JSON File,Model Execution

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