Study on Single-Event Transient Hardness of Semi-Enclosed Gate NMOS Zhuoxiang Wang,Gang Li,Minghua Tangmdpi(2025)引用 0|浏览3关键词TCAD,semi-enclosed,NMOS,SETAI 理解论文溯源树样例生成溯源树,研究论文发展脉络Chat Paper正在生成论文摘要