Program for the X-Ray Phase Analysis of Synchrotron Data

P. S. Dubinin,A. N. Zaloga,I. S. Yakimov, O. E. Bezrukova,A. S. Samoilo,M. S. Syrtanov,A. N. Shmakov,A. D. Teresov,A. A. Leonov,V. V. Denisov

Journal of Surface Investigation X-ray, Synchrotron and Neutron Techniques（2025）

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synchrotron radiation,in situ analysis,diffraction analysis,X-ray phase analysis,corundum number method,Rietveld method,coherent-scattering region,Scherrer method,multilayer coatings

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