Unveiling the Intricate Dynamic Charactristics of FeFETs with a MFMIS Structure: Experiment and Modeling

Xiaolin Wang,Zijie Zheng,Leming Jiao,Xuanqi Chen, Yang Feng,Chen Sun,Zuopu Zhou,Dong Zhang,Gan Liu,Bich-Yen Nguyen,Gengchiau Liang,Kai Ni,Xiao Gong

2024 IEEE International Electron Devices Meeting (IEDM)（2024）

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Dynamic Model,Depolarization,Dynamic Performance,Dielectric Layer,Operation Speed,Charge Trapping,Fast Speed,Slow Speed,Operation Stage,Dispersion Characteristics

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