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In Situ Reflection Electron Microscopy for the Surface Processes Analysis During Sublimation and Epitaxial Growth of Layered Metal Chalcogenides

Sergei A. Ponomarev,Dmitry I. Rogilo, Konstantin E. Zakhozhev, Dmitry A. Nasimov,Nina N. Kurus,Anton K. Gutakovskii, Konstantin A. Kokh,Alexander G. Milekhin,Dmitry V. Sheglov,Alexander V. Latyshev

Modern Electronic Materials（2024）

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