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Heavy Ion Induced SEUs and Layer Dependence in Dual-Deck 3D NAND Flash Memories

Yang Jiao, Jinhu Yang,Qi Wang,Kai Xi, Xinyu Li,Yuzhu Liu,Qiyu Chen,Zongzhen Li,Youmei Sun,Peixiong Zhao,Jie Liu

IEEE Transactions on Nuclear Science（2025）

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Key words
Charge trap memory,dual-deck 3D NAND Flash,heavy ion,multi-cell upsets,single-event upset
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