Physical Compact Model for Source-Gated Transistors for DC Application
IEEE TRANSACTIONS ON ELECTRON DEVICES（2025）
Key words
Mathematical models,Thin film transistors,Schottky barriers,Thermionic emission,Logic gates,Transistors,Integrated circuit modeling,Semiconductor device modeling,Semiconductor device measurement,SPICE,Compact model,Schottky barrier,source-gated transistor (SGT),thin-film transistor (TFT)
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