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Validating Terrestrial SER in 12-, 28- and 65-Nm SRAMs Estimated by Simulation Coupled with One-Time Neutron Irradiation

Kazusa Takami, Yuibi Gomi, Ryuichi Yasuda,Shin-ichiro Abe,Masatoshi Itoh,Hiroki Kanda,Mitsuhiro Fukuda,Masanori Hashimoto

IEEE Transactions on Nuclear Science（2025）

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Key words
Soft errors,single event upsets (SEUs),SERs,neutrons,PHITS
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