Radiation Effects in Quanta Image Sensors

Joanna Krynski, Alexandre Neyret, Vivian Bernard,Valérian Lalucaa,Alexandre Le Roch,Alex Materne,Cédric Virmontois,Vincent Goiffon

IEEE Transactions on Nuclear Science（2025）

Cited 0|Views3

Key words

Active pixel sensor (APS),CMOS image sensor (CIS),dark current distribution model,displacement damage dose (DDD),total-ionizing dose (TID),single-photon imaging,sub-electron read noise,quanta image sensor (QIS)

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