Single-Event Functional Interrupt Mapping of Cm-Size Microprocessor Using Ion Microbeam

Jinlong Guo, Wenbo Tian,Guangbo Mao, Hongjun You,Can Zhao,Ruqun Wu, Wenjing Liu,Cheng Shen,Hongjin Mou, Lei Zhang,Guanghua Du

IEEE Transactions on Nuclear Science（2025）

Institute of Modern Physics | Shanghai Aerospace Electronic Technology Institute

Cited 0|Views4

Abstract

Single-Event Functional Interrupts (SEFIs) in Microprocessors due to high-energy space radiation have important implications on reliability and safety of spaceborne systems. To study the system-level SEFI of the commercially available MPC750 Microprocessor, which has promising aerospace applications, a large-size hybrid mapping method was established based on a high energy heavy ion microbeam platform. SEFI-sensitive areas across the centimeter-size die were then mapped using the krypton ion microbeam in conjunction with the decrypted device layout. Additionally, detailed SEFI cross-sections, generation conditions, and propagation mechanisms were analyzed, highlighting the significance of the exception model in SEFI generation and mitigation. This investigation provides valuable insights into radiation reliability and radiation-hardening design for the MPC750 and Harvard Architecture Microprocessors in space applications.

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Key words

SEFI,Microprocessor,Ion Microbeam,Mapping

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【要点】：本文通过高能重离子微束平台，对商业MPC750微处理器进行厘米级单事件功能中断（SEFI）映射，分析了SEFI的生成条件和传播机制，为辐射可靠性和辐射硬化设计提供了有价值的见解。

【方法】：研究采用了一种大型混合映射方法，基于高能重离子微束平台，并结合解密设备布局，对SEFI敏感区域进行了映射。

【实验】：使用氪离子微束对MPC750微处理器进行了SEFI映射实验，数据集名称未在文中提及，但实验结果揭示了异常模型在SEFI生成和缓解中的重要性。