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Evaluation of Performance and Reliability of TFT Devices with Ultra-Thin HfTiO Dielectric Layer Deposited by Plasma Enhanced Atomic Layer Deposition

Wen-Zhi Zhang, Xiao-Ying Zhang, Zhi-Xuan Zhang, Yun-Shao Cho,Chien-Jung Huang,Gao Peng,Lin-Qin Jiang,Yu Qiu,Shui-Yang Lien

SURFACE & COATINGS TECHNOLOGY(2025)

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Key words
Titanium-doped hafnium oxide,Atomic layer deposition,High dielectric constant,Thin film transistor
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