A Lifting-Wavelet-based Iterative Thresholding Correction for Atomic Force Microscopy Images with Vertical Distortion
NANOTECHNOLOGY AND PRECISION ENGINEERING（2025）
Key words
Atomic force microscopy,lifting wavelet analysis,iterative thresholding algorithm,vertical distortion
AI Read Science
Must-Reading Tree
Example
Generate MRT to find the research sequence of this paper
Chat Paper
Summary is being generated by the instructions you defined