Retention Accelerated Testing for 3D QLC NAND Flash Memory: Characterization, Analysis, and Modeling

Shaoqi Yang,Meng Zhang,Xuepeng Zhan, Peng Guo, Xiaohuan Zhao, Guangkuo Yang, Xinyi Guo,Jixuan Wu,Fei Wu,Jiezhi Chen

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems（2025）

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关键词

3D NAND Flash Memory,Data Retention,Temperature,Apparent Activation Energy,Lifetime,Reliability

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