Characterizing Hole Trap Production Due to Proton Irradiation in Germanium Cross-Strip Detectors

Sean N. Pike,Steven E. Boggs, Gabriel Brewster, Sophia E. Haight, Jarred M. Roberts,Albert Y. Shih, Joanna Szornel, John A. Tomsick,Andreas Zoglauer

Experimental Astronomy（2025）

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Germanium semiconductor detectors,Charge trapping,Gamma-ray spectroscopy,Radiation damage

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