Correlations Between In-Line X-ray Diffraction Data and In-Field Critical Current of Long, 4-Μm Thick Film REBCO Tapes Made by Advanced MOCVD

Chirag Goel,Mahesh Paidpilli,Siwei Chen,Yi Li, Mahandar Oad, Lingfeng Zhu,Goran Majkic,Venkat Selvamanickam

IEEE TRANSACTIONS ON APPLIED SUPERCONDUCTIVITY（2025）

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关键词

Manufacturing,Correlation,MOCVD,Magnetic fields,Real-time systems,Magnetic field measurement,Current measurement,Correlation coefficient,Zirconium,Temperature measurement,REBCO,high-temperature superconductor,characterization of conductors,manufacturing,magnetization,critical current

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