Degradation of ZnO-Based Buffer Layers for Thin Film CdSeTe/CdTe Solar Cells
2024 IEEE 52nd Photovoltaic Specialist Conference (PVSC)（2024）
关键词
Degradation,accelerated lifetime testing (ALT),stability,ZnO,MgZnO (MZO),GaMgZnO (GMZO),buffer layer
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