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Automatic Classification of Defects in Solar Photovoltaic Panels Using UV-Fluorescence: A Deep Learning Approach

Sina Lotfian, Andrew Ballen,Dylan J. Colvin, Nadia Khan, Brent Thompson,Kristopher O. Davis,Mengjie Li

2024 IEEE 52nd Photovoltaic Specialist Conference (PVSC)(2024)

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Key words
Data-driven,PV reliability and durability,Degradation analysis
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