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Mitigating Power and Process Variation for Analog CIM Design Migration

Shih-Han Chang, Shih-Yu Chen, Chun-Wen Yang, Hau-Wei Huang, Yu-Cheng Yang, Wei-Liang Chen,Chien-Nan Liu,Hung-Ming Chen

International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design(2024)

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Key words
analog design migration,process variation,analog circuit sizing,evolutionary algorithm,computing in memory
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