WeChat Mini Program
Old Version Features

Optimizing De-trap Pulses in Gate-injection Type Ferroelectric NAND Cells to Minimize Read after Write Delay Issue

Giuk Kim,Hyojun Choi, Hongrae Cho,Sangho Lee,Hunbeom Shin, Hyunjun Kang,Hoon Kim, Seokjoong Shin, Seonjae Park, Sunseong Kwon,Youngjin Lim, Kang Kim, Jong Min Chung,Il-Kwon Oh,Sang-Hee Ko Park,Jinho Ahn,Sanghun Jeon

IEEE ELECTRON DEVICE LETTERS（2024）

Cited 0|Views2
Key words
Ferroelectric NAND flash,MIFIS FeFET,read after write delay,RAWD,de-trap pulse
AI Read Science
Must-Reading Tree
Example
Generate MRT to find the research sequence of this paper
Chat Paper
Summary is being generated by the instructions you defined