Impact of External Magnetic Fields on STT-MRAM: an Application Note

Bernard Dieny, Sanjeev Aggarwal,Vinayak Bharat Naik,Sebastien Couet,Thomas Coughlin,Shunsuke Fukami,Kevin Garello, Jack Guedj,Jean Anne C. Incorvia, Laurent Lebrun,Kyung-Jin Lee, Daniele Leonelli,Yonghwan Noh, Siamak Salimy,Steven Soss, Luc Thomas,Weigang Wang,Daniel C. Worledge

IEEE Electron Devices Magazine（2024）

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Key words

Magnetic Field,External Field,External Magnetic Field,Spin Transfer Torque,Magnetic Field Source,Printed Circuit Board,Magnetic Materials,Permanent Magnet,Use Of Sensors,High Magnetic Field,Magnetic Anisotropy,Maximum Field,Source Field,Electric Lines,Magnetic Configuration,Magnetic Layer,Stray Field,Magnetic Field Range,Magnetic Shielding,Free Layer,Reference Layer,Magnetic Field Sensors,Magnetic Field Generation,Disk Drive,Magnetic Environment,International Electrotechnical Commission,Automotive Applications,Free Space,Field Strength,Radial Distance

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