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IGS-IGD Gate Current Noise Model at Low Frequency

E. Torri, O. Leman,P. Malcovati,A. Baschirotto

2024 19TH CONFERENCE ON PHD RESEARCH IN MICROELECTRONICS AND ELECTRONICS, PRIME 2024(2024)

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Key words
Gate Current,Shot Noise,Low-frequency noise,Analog Integrators
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