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Operation Scheme Optimizations to Achieve Ultrahigh Endurance (1010) in Flash Memory

Yang Feng, Xinyi Guo,Chengcheng Wang,Yueran Qi,Junyu Zhang,Jing Liu,Xuepeng Zhan,Jixuan Wu,Jiezhi Chen

IEEE TRANSACTIONS ON ELECTRON DEVICES（2024）

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Key words
Flash memories,Ear,Degradation,Optimization,Three-dimensional displays,In-memory computing,Stress,Endurance,flash memory,storage class memory (SCM)
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