A 578-TOPS/W RRAM-Based Binary Convolutional Neural Network Macro for Tiny AI Edge Devices

Lixun Wang,Yuejun Zhang,Pengjun Wang,Jianguo Yang,Huihong Zhang,Gang Li, Qikang Li

IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS（2024）

引用 0|浏览4

关键词

Computer architecture,Convolution,Hardware,Accuracy,Power demand,Resistance,Microprocessors,Vectors,Logic,Kernel,Binary neural network (BNN),circuit reliability,memory,power consumption,resistive random access memory (RRAM)

AI 理解论文

溯源树

样例

生成溯源树，研究论文发展脉络

Chat Paper

正在生成论文摘要