Insights into Overcurrent-Induced Gate Breakdown and Failure Analysis of 1200 V SiC MOSFETs

Ruolan Wang, Mingsheng Fang, Li Song, Xuanyu Hu, Anli Yang, Yupu Wang,Kaixuan Li, Ting Liu, Cao Meng,Dandan Wang,Bing Yang,Qichao Ding,Zhihong Mai

2024 IEEE INTERNATIONAL SYMPOSIUM ON THE PHYSICAL AND FAILURE ANALYSIS OF INTEGRATED CIRCUITS, IPFA 2024（2024）

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1200V SiC MOSFET,Failure analysis,Overcurrent failure mechanism

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