Interface Modeling Analysis Using Density Functional Theory in Highly Reliable Pt/HfO2/TaOx/Ta Self-Rectifying MemristorSheng-Guang Ren,Ge-Qi Mao,Yi-Bai Xue,Yu Zhang,Jia-Yi Sun,Wen-Bin Zuo,Yi Li,Kan-Hao Xue,Xiang-Shui MiaoAPPLIED PHYSICS LETTERS（2024）引用 0|浏览11AI 理解论文溯源树样例生成溯源树，研究论文发展脉络Chat Paper正在生成论文摘要
