Applicability of Energy-Theta Mapping in Resonant Soft X-ray Reflectometry to Probe Depth Dependence of Oxidation State and Crystallographic Environment in Iron Oxide Multilayers
THIN SOLID FILMS（2024）
关键词
X-ray resonant reflectometry,2D reflectance maps,Non-destructive depth profiling,Low optical contrast,Nanoscale heterostructures,Iron oxide,Computer modeling
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