LELAPE: an Open-Source Tool to Classify SEUs According to Their Multiplicity in Radiation-Ground Tests on Memories
IEEE Transactions on Nuclear Science（2024）
Key words
multiple-cell upset (MCU),single-bit upset (SBU),single-bit upset (SBU),single-bit upset (SBU),Memory,Memory,Memory,Memory,Memory,single-event upset (SEU) sensitivity,single-event upset (SEU) sensitivity,single-bit upset (SBU),single-event upset (SEU) sensitivity
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