Electron Migration Via Transversal Electrostatic Field for Suppressing Local-Regional Multipactor Breakdown

S. Lin, H. Zhong, C. Chen, Y. Li, M. Cao,P. Wong, P. Zhang,J. Verboncoeur

2024 IEEE International Conference on Plasma Science (ICOPS)（2024）

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关键词

Electron Migration,Multipactor Breakdown,Performance Degradation,Practical Engineering,Transverse Field,High Levels Of Power,Radiofrequency Field,Secondary Electron Emission

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