Highly Stable PUFs Based on Stacked Voltage Divider for Near-Zero BER Native Sensitivity to Voltage Variations
IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS I-REGULAR PAPERS（2024）
Key words
Voltage measurement,Transistors,Circuits,Logic gates,Circuit stability,Thermal stability,Bit error rate,Hardware security,IoT,physically unclonable function,voltage divider,CMOS design,masking
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