A Novel Approach to Predict the Defect Density in Software Application Using Linear Regression Algorithm

Saravanan. N, Dharanya. C, Dhina M, Ranjth Kumar. E, Shanmathi Devi. L

2024 International Conference on Science Technology Engineering and Management (ICSTEM)（2024）

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Key words

Defect Density,Machine Learning,Linear Regression,Software Development,Absolute Error,Square Error,Metrics,CBR

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