Compact Model Parameter Extraction Via Derivative-Free Optimization
IEEE ACCESS（2024）
Key words
Semiconductor process modeling,Optimization,Semiconductor device modeling,Data models,Data mining,Computational modeling,Numerical models,Schottky diodes,Parameter extraction,SPICE,HEMTs,ASM-HEMT,compact model,derivative-free optimization,device modeling,diamond Schottky diode,GaN HEMTs,parameter extraction,SPICE diode model
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