Spoke Characterization in Re-Entrant Backward Wave Crossed-Field Amplifiers Via Simulation
IEEE Transactions on Electron Devices（2024）
Key words
Electrons,Visualization,Oscillators,Data visualization,Trajectory,Power generation,Power amplifiers,Crossed-field amplifiers (CFAs),electron emission,L-band,electron tubes,gain,high power amplifiers,magnetrons,microwave amplifiers,plasma simulation,radio frequency (RF),vacuum electronics
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