Interlaboratory Comparison of Dielectric Measurements from Microwave to Terahertz Frequencies Using VNA-Based and Optical-Based Methods
IEEE Transactions on Microwave Theory and Techniques（2024）
Key words
Frequency measurement,Particle measurements,Atmospheric measurements,Millimeter wave measurements,Resonators,Permittivity measurement,Laboratories,Interlaboratory comparison,loss tangent,material characterization,material characterization kit (MCK),millimeter-wave measurement,open resonator,permittivity,terahertz measurement,time-domain spectroscopy (TDS),vector network analyzer (VNA)
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