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Design and High-Frequency Characterization of a Wafer-Scale Vertical Bridge Structure Nanoscale Vacuum Electronic Device

Ruihan Huang,Feiliang Chen,Junxiang Yang,Haiquan Zhao,Yazhou Wei,Xiangdong Wang,Hao Jiang,Fan Yang,Yang Liu,Mo Li,Jian Zhang

IEEE TRANSACTIONS ON ELECTRON DEVICES（2024）

Cited 1|Views15
Key words
Bridge structure,high-frequency characteristics,nanoscale vacuum electronic device (NVED),small-signal model,wafer scale
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