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Improved Accuracy and Robustness of Electron Density Profiles from JET’s X-mode Frequency-Modulated Continuous-Wave Reflectometers

R. B. Morales,A. Salmi,P. Abreu,C. H. S. Amador,L. Appel,P. Carman,J. Fessey,J. Flanagan,M. Fontana,L. Frassinetti,C. Giroud,S. Hacquin,S. Heuraux,L. Meneses,G. Ronchi,R. Sabot,A. Silva,A. Sirinelli,G. Szepesi,D. Taylor,D. Terranova

REVIEW OF SCIENTIFIC INSTRUMENTS（2024）

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